{"id":10356,"date":"2026-07-19T12:25:57","date_gmt":"2026-07-19T12:25:57","guid":{"rendered":"https:\/\/ic-vendor.com\/hk-2-s\/"},"modified":"2026-07-19T12:25:57","modified_gmt":"2026-07-19T12:25:57","slug":"hk-2-s","status":"publish","type":"post","link":"https:\/\/ic-vendor.com\/es\/hk-2-s\/","title":{"rendered":"HK-2-S"},"content":{"rendered":"

Productos<\/h2>\n

The HK-2-S is a test point from Hammond Manufacturing, designed for automated PCB insertion. It provides a convenient probe-accessible point on the circuit board for testing, debugging, and calibration during manufacturing and field service. The 1206 package size is compatible with standard SMD pick-and-place equipment.<\/p>\n

Especificaciones<\/h2>\n\n\n\n\n\n\n\n\n
Component Type<\/td>\nTest Point<\/td>\n<\/tr>\n
Paquete<\/td>\n1206 (3216 Metric)<\/td>\n<\/tr>\n
Mounting<\/td>\nSMD, compatible with auto-insertion<\/td>\n<\/tr>\n
Material<\/td>\nPhosphor Bronze or Beryllium Copper<\/td>\n<\/tr>\n
Plating<\/td>\nTin\/Lead or Matte Tin<\/td>\n<\/tr>\n
Color<\/td>\nRed (typical)<\/td>\n<\/tr>\n
Fabricante<\/td>\nHammond Manufacturing<\/td>\n<\/tr>\n<\/table>\n

Caracter\u00edsticas<\/h2>\n
    \n
  • Compact 1206 footprint for high-density boards<\/li>\n
  • Compatible with automated pick-and-place<\/li>\n
  • Probe-accessible for in-circuit testing (ICT)<\/li>\n
  • Low profile SMD design<\/li>\n
  • Cost-effective test access solution<\/li>\n<\/ul>\n

    Aplicaciones<\/h2>\n
      \n
    • PCB in-circuit test (ICT) access points<\/li>\n
    • Debug and development probe points<\/li>\n
    • Production line functional test access<\/li>\n
    • Field service calibration points<\/li>\n
    • Signal monitoring and measurement access<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"

      Product Overview The HK-2-S is a test point from Hammond Manufacturing, designed for automated PCB insertion. It provides a convenient probe-accessible point on the circuit board for testing, debugging, and calibration during manufacturing and field service. The 1206 package size is compatible with standard SMD pick-and-place equipment. Key Specifications Component Type Test Point Package 1206 […]<\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"open","ping_status":"","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[66],"tags":[1638,1639],"chip_brand":[1637],"class_list":["post-10356","post","type-post","status-publish","format-standard","hentry","category-connectors-interconnect-devices","tag-hk-2-s","tag-test-point","chip_brand-hammond"],"acf":{"brief_explanation":"SMD Test Point 1206 for Auto Insertion, Hammond Manufacturing","date_code":"","package_case":"1206 (3216 Metric), SMD","in_stock":18000,"datasheet":"https:\/\/www.hammondmfg.com\/testpoints.htm","price":"","product_introduction":"The HK-2-S is a surface-mount test point from Hammond Manufacturing, designed for automated PCB insertion in 1206 package size. It provides a convenient, probe-accessible point on the circuit board for in-circuit testing (ICT), debugging, calibration, and signal monitoring during manufacturing and field service. The compact footprint and SMD compatibility make it ideal for high-density PCB layouts.","working_principle":"The test point is a passive conductive pad\/structure that provides an accessible physical connection point on the PCB for test probes. During in-circuit testing, spring-loaded probes (pogo pins) make contact with the test point to apply test stimuli or measure signals without requiring dedicated test connectors. The test point has no active electrical function \u2014 it simply provides a reliable, accessible metal contact point that is connected to the circuit node of interest.","pin_description":"
      Terminal<\/th>Function<\/th><\/tr>
      1<\/td>Circuit node connection<\/td><\/tr>
      2<\/td>Circuit node connection (optional, depending on configuration)<\/td><\/tr><\/table>","application_scenarios":"
      • PCB in-circuit test (ICT) bed-of-nails access<\/li>
      • Engineering debug and development probe access<\/li>
      • Production functional test measurement points<\/li>
      • Field service adjustment and calibration access<\/li>
      • Signal integrity monitoring during system integration<\/li><\/ul>","alternative_models":"
        Manufacturer<\/th>Part Number<\/th>Package<\/th>Notes<\/th><\/tr>
        Keystone<\/td>5016<\/td>1206<\/td>SMD test point<\/td><\/tr>
        Mill-Max<\/td>3803-0<\/td>Custom<\/td>Test point pad<\/td><\/tr><\/table>"},"_links":{"self":[{"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/posts\/10356","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/comments?post=10356"}],"version-history":[{"count":0,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/posts\/10356\/revisions"}],"wp:attachment":[{"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/media?parent=10356"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/categories?post=10356"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/tags?post=10356"},{"taxonomy":"chip_brand","embeddable":true,"href":"https:\/\/ic-vendor.com\/es\/wp-json\/wp\/v2\/chip_brand?post=10356"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}